DocumentCode :
3265129
Title :
The use of model-based test requirements throughout the product life cycle
Author :
Bukata, Eric ; Davis, Danny C. ; Shombert, Lee
Author_Institution :
AverStar Inc., Vienna, VA, USA
fYear :
1999
fDate :
1999
Firstpage :
53
Lastpage :
58
Abstract :
Test requirements, which are generally collected in multiple disparate formats throughout the life cycle of an electronic product, could be used in various applications that reduce test and development cycle times and increase the confidence in the final test program. Unfortunately, test requirements are seldom captured in a consistent format that may be processed by a computer, thus eliminating the possibility of using such requirements in an engineering application. Additionally, such an approach disallows test requirements captured in one segment of the product life cycle to be reused in subsequent life cycle stages. This paper describes a model-based methodology, specifically the Test Requirements Model (TeRM) which can be shown to facilitate the transfer of test-related product information between various stages of the life cycle. This transportability, in conjunction with an exchange format that can be processed by a computer, permits test requirement information to support value-added applications in the engineering process throughout the life cycle of a product
Keywords :
automatic test equipment; automatic test software; concurrent engineering; life cycle costing; product development; program verification; exchange format; final test program confidence; model-based methodology; model-based test requirements; product information transfer; product life cycle; test and development cycle times; test program verification; test requirements model; test resource allocation; transportability; value-added applications; Application software; Costs; Electronic equipment testing; Job shop scheduling; Life testing; Modeling; Robustness; Springs; System testing; Systems engineering and theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
Conference_Location :
San Antonio, TX
ISSN :
1080-7725
Print_ISBN :
0-7803-5432-X
Type :
conf
DOI :
10.1109/AUTEST.1999.800355
Filename :
800355
Link To Document :
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