DocumentCode
3265221
Title
High performance bipolar spin transistor
Author
Lo, C.K. ; Huang, Y.W.
Author_Institution
OES, Ind. Technol. Res. Inst., Hsinchu, Taiwan
Volume
1
fYear
2004
fDate
18-21 Oct. 2004
Firstpage
746
Abstract
In this article we demonstrate high performance giant magneto resistive spin transistor (GMRST) and magneto tunneling resistive spin transistor (MTRST) which base on the technologies of giant magneto resistance (GMR) and tunneling magneto resistance (TMR) effects. A p-n junction whose leakage is less than a Schottky diode is used as a potential barrier to select spin electrons. In case of GMRST the collector current, Ic varies from 95 μA at magnetically parallel state to 2.6 μA at magnetically anti-parallel state and gives a percentage change of more than 3400% at 77K. For the same magnetic states at room temperature the change reduces to about 53.4% with Ic varies from 213μA to 138.8μA. As for the MTRST, the change of Ic is about 45% at room temperature with current varies from 29μA to 42μA. The transfer ratio of these two spin devices increases as emitter bias is increased; however, higher emitter current does not benefit the change of magneto current. Memory effect which is the intrinsic behavior of magnetic phenomena is also demonstrated.
Keywords
Schottky barriers; bipolar transistors; giant magnetoresistance; p-n junctions; tunnelling magnetoresistance; 138.8 to 213 muA; 2.6 to 95 muA; 29 to 42 muA; 77 K; Schottky diode; giant magneto resistance effect; giant magneto resistive spin transistor; high performance bipolar spin transistor; magnetic phenomena; magnetically anti-parallel state; magneto tunneling resistive spin transistor; memory effect; p-n junction; potential barrier; spin electrons; tunneling magneto resistance effect; Electrons; Magnetic devices; Magnetic fields; Magnetoelectronics; Materials science and technology; P-n junctions; Scattering; Spin polarized transport; Temperature sensors; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN
0-7803-8511-X
Type
conf
DOI
10.1109/ICSICT.2004.1435111
Filename
1435111
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