Title :
Instrument driver design
Author :
Vuu, Lan ; Khan, Amin
Author_Institution :
Air Logistics Center, Hill AFB, UT, USA
Abstract :
Many organizations in Automatic Test Equipment (ATE) are involved in upgrading aging test stations or development of new test stations to state-of-the-art VXI plug&play technology. The instrument drivers for the F-16 Analog Test Station Sustainment (FATSS) were developed using the LABWindows/CVI environment with Object-Oriented (OO) programming design. The objective of this paper is to illustrate the driver development using this OO architecture
Keywords :
automatic test equipment; automatic test software; device drivers; object-oriented programming; peripheral interfaces; virtual instrumentation; ATE; F-16 Analog Test Station Sustainment; LABWindows/CVI environment; OO programming design; VXI plug&play technology; development environment tools; hardware layers; instrument drivers; legacy systems; public functions layers; upgrading aging test stations; vendor layers; Aging; Automatic test equipment; Hardware; Instruments; Logistics; Manufacturing; Object oriented programming; Software engineering; Software libraries; Software testing;
Conference_Titel :
AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-5432-X
DOI :
10.1109/AUTEST.1999.800368
