• DocumentCode
    3265816
  • Title

    Reusable test executive and test programs methodology and implementation comparison between HP VEE and LabView

  • Author

    Klinger, Motti

  • Author_Institution
    Syst. Eng., Tiltan, Benei-Beraq, Israel
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    305
  • Lastpage
    312
  • Abstract
    The paper outlines the requirements for a reusable test executive and reusable test programs. The concepts of generic test programs and test program sets are introduced then the process of creating test program sets (TPS) from generic test programs, using a TPS editor is described. Various aspects of implementation are compared between HP VEE and NI LabView
  • Keywords
    automatic test software; device drivers; software reusability; HP VEE; NI LabView; TPS editor; composite data types; execution engine; generic test program sets; generic test programs; implementation comparison; instrument drivers; operator interface; reusable test executive; reusable test programs; user management; Control systems; Electronic equipment testing; Engines; Software testing; System testing; Systems engineering and theory; Tellurium; Temperature; Time to market; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
  • Conference_Location
    San Antonio, TX
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-5432-X
  • Type

    conf

  • DOI
    10.1109/AUTEST.1999.800395
  • Filename
    800395
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3265816