DocumentCode
3265897
Title
Conduction and switching characteristics of III-V Schottky rectifiers for low loss switching
Author
Anderson, S.J. ; Almesfer, B. ; Munukutla, L.V.
Author_Institution
Motorola Inc., Phoenix, AZ, USA
fYear
1992
fDate
23-27 Feb 1992
Firstpage
433
Lastpage
438
Abstract
The authors report on the fabrication and evaluation of silicon and gallium arsenide switching diode technology. It is noted that the benefit of fabricating Schottky rectifiers using gallium arsenide material compared to silicon is an order of magnitude improvement in switching speed at voltages above 200 V. Gallium arsenide rectifiers also have the benefit of lower drift region ON resistance compared to silicon. Unfortunately the benefit of the reduction in drift region assistance is not realized due to the limited control of the barrier height. The barrier height of metals in contact with gallium arsenide is fairly independent of the metal. Understanding the surface physics of wide bandgap semiconductors and a fundamental understanding of the metal-semiconductor interface will be required before the ON resistance benefit of gallium arsenide can be realized. However, gallium arsenide Schottky rectifiers with significant speed performance at voltages up to 400 V justify the selection of this technology for high-frequency power conversion applications
Keywords
III-V semiconductors; Schottky-barrier diodes; gallium arsenide; losses; rectifiers; switching circuits; GaAs; HF power convertors; III-V semiconductors; Schottky rectifiers; Si; barrier height; conduction; diode; drift region ON resistance; fabrication; losses; metal-semiconductor interface; performance; speed; switching; wide bandgap; Conducting materials; Fabrication; Gallium arsenide; III-V semiconductor materials; Rectifiers; Schottky diodes; Semiconductor diodes; Silicon; Surface resistance; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition, 1992. APEC '92. Conference Proceedings 1992., Seventh Annual
Conference_Location
Boston, MA
Print_ISBN
0-7803-0485-3
Type
conf
DOI
10.1109/APEC.1992.228378
Filename
228378
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