• DocumentCode
    3265916
  • Title

    Robotic probing of conformally coated circuit cards

  • Author

    Chirnitch, Joseph ; Dalton, Aaron M.

  • Author_Institution
    BCO Inc., Billerica, MA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    337
  • Lastpage
    343
  • Abstract
    In recent years robotics have been utilized in conjunction with diagnostic probing of circuit cards. Traditionally, manual probing is required to isolate component failures. This requires program interruption, use of reference documents and judgment by the operator. It is expected that the operator will locate the proper test point and place the probe with sufficient force to make contact. Often, errors are introduced because the operator probes the wrong test point or applies insufficient force. These errors result in: replacement of components that have not failed, additional testing, waste of spares and an increase in test time. The incorporation of robotics into the process can eliminate these problems. Using a robotic probe raises questions regarding accuracy of probe placement, its applied force, and potential damage to circuit card traces. The question of insufficient probe force with conformally coated circuit cards is of special concern. A probe that does not make contact results in erroneous conclusions that can cause slowdown and waste. This study focuses on quantifying the force required in conjunction with a robotic probe to make reliable contact. A variety of probe types and various conformal coatings were tested to provide guidelines in their use for robotic testing
  • Keywords
    automatic test equipment; automatic testing; conformal coatings; fault location; industrial robots; printed circuit testing; robot vision; COTS components; VXI test station; applied force; camera images; conformally coated circuit cards; diagnostic probing; fault isolation; functional test; penetration test; potential damage; probe placement accuracy; robotic probing; robotic testing; test point accumulation; Automatic testing; Circuit faults; Circuit testing; Coatings; Connectors; Integrated circuit testing; Probes; Robotic assembly; Robots; Signal design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
  • Conference_Location
    San Antonio, TX
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-5432-X
  • Type

    conf

  • DOI
    10.1109/AUTEST.1999.800400
  • Filename
    800400