DocumentCode :
3265959
Title :
A hidden Markov model based algorithm for online fault diagnosis with partial and imperfect tests
Author :
Ying, Jie ; Kirubarajan, T. ; Pattipati, Krishna R. ; Deb, Somnath
Author_Institution :
Dept. of Electr. & Syst. Eng., Connecticut Univ., Storrs, CT, USA
fYear :
1999
fDate :
1999
Firstpage :
355
Lastpage :
366
Abstract :
In this paper, we present a Hidden Markov Model (HMM) based algorithm for online fault diagnosis in complex large-scale systems with partial and imperfect tests. The HMM-based algorithm handles test uncertainties and inaccuracies, finds the best estimate of system states and identifies the dynamic changes in system states, such as from a fault-free state to a faulty one. We also present two methods to estimate the model parameters, namely, the state transition probabilities and the instantaneous probabilities of observed test outcomes, for adaptive fault diagnosis. In order to validate the adaptive parameter estimation techniques, we present simulation results with and without the knowledge of HMM parameters. In addition, the advantages of using the HMM approach over a Hamming-distance based fault diagnosis technique are quantified. Tradeoffs in complexity versus performance of the diagnostic algorithm are discussed
Keywords :
adaptive estimation; failure analysis; fault diagnosis; hidden Markov models; large-scale systems; parameter estimation; reliability theory; signal flow graphs; state estimation; Viterbi algorithm; adaptive fault diagnosis; adaptive parameter estimation techniques; complex large-scale systems; complexity versus performance tradeoffs; digraph model; dynamic changes; fault-free state; faulty state; hidden Markov model based algorithm; imperfect tests; instantaneous probabilities; linear difference equation; model parameters; observed test outcomes; online fault diagnosis; partial tests; sliding window technique; state transition probabilities; system states; test inaccuracies; test uncertainties; Fault diagnosis; Hidden Markov models; Intelligent sensors; Monitoring; Parameter estimation; Sensor systems; Signal processing algorithms; State estimation; System testing; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
Conference_Location :
San Antonio, TX
ISSN :
1080-7725
Print_ISBN :
0-7803-5432-X
Type :
conf
DOI :
10.1109/AUTEST.1999.800402
Filename :
800402
Link To Document :
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