• DocumentCode
    3266100
  • Title

    P1522: a formal standard for testability and diagnosability measures

  • Author

    Kaufman, Mark ; Sheppard, John

  • Author_Institution
    NWAS, Corona, CA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    411
  • Lastpage
    418
  • Abstract
    Members of the Maintenance and Diagnostic Control subcommittee of IEEE´s Standards Coordinating Committee 20 (SCC20) are developing a standard for testability and diagnosability characteristics and metrics. The objective of this standard, P1522, is to provide notionally correct, useful, and mathematically precise definitions of testability measures that may be used to either measure or predict the testability of a system. Notionally correct means that the measures are not in conflict with intuitive and historical representations. The end purpose is to provide an unambiguous source for definitions of testability and diagnosability metrics. In this paper, we present a summary of the work completed so far on P1522 and a roadmap for its completion. We cover the organization of the standard, the sources of the measures, how these measures relate to the other AI-ESTATE standards, and information modeling
  • Keywords
    IEEE standards; automatic test equipment; design for testability; diagnostic expert systems; fault diagnosis; production testing; AI-ESTATE standards; IEEE P1522; completion roadmap; diagnosability measures; fault isolation; formal standard; information modeling; intelligent test environment; knowledge representation; production testing; testability measures; trial use standard; Artificial intelligence; Control systems; Degradation; Electrical equipment industry; Electronic equipment testing; Government; Measurement standards; Standards development; Standards organizations; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
  • Conference_Location
    San Antonio, TX
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-5432-X
  • Type

    conf

  • DOI
    10.1109/AUTEST.1999.800409
  • Filename
    800409