• DocumentCode
    3266518
  • Title

    Multiple-input resonant-tunneling logic gates for flash A/D converter applications

  • Author

    Tsuji, Yuki ; Waho, Takao

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Sophia Univ., Tokyo, Japan
  • fYear
    2004
  • fDate
    19-22 May 2004
  • Firstpage
    8
  • Lastpage
    13
  • Abstract
    Multiple-input resonant-tunneling (RT) logic gates have been proposed for flash analog-to-digital converter applications. An error-mode operation has been found in conventional RT gates called MOBILE, when the number of inputs increases. By introducing an RTD/HEMT series connection, to suppress the error operation, we can successfully design 4-, 8-, and 16-input RT gates, which are essential to obtain compact flash ADCs.
  • Keywords
    analogue-digital conversion; high electron mobility transistors; logic gates; resonant tunnelling diodes; threshold logic; 16 bit; 4 bit; 8 bit; MOBILE; RT gates; RTD/HEMT series connection; error-mode operation suppression; flash A/D converters; multiple-input logic gates; resonant-tunneling logic gates; threshold logic circuit; Analog-digital conversion; Circuit simulation; HEMTs; Logic circuits; Logic devices; Logic gates; MODFETs; Resonant tunneling devices; Signal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multiple-Valued Logic, 2004. Proceedings. 34th International Symposium on
  • ISSN
    0195-623X
  • Print_ISBN
    0-7695-2130-4
  • Type

    conf

  • DOI
    10.1109/ISMVL.2004.1319912
  • Filename
    1319912