• DocumentCode
    3266566
  • Title

    Electromagnetic and mechanical analysis for micromachined filter

  • Author

    Li, Xiuping ; Yook, Jong-Gwan ; Dong, Chun-Ying ; Wang, Hong ; Law, Choi Look ; Aditya, Sheel

  • Author_Institution
    Dept. of Electr. & Electron., Yonsei Univ., Seoul, South Korea
  • Volume
    3
  • fYear
    2004
  • fDate
    18-21 Oct. 2004
  • Firstpage
    1735
  • Abstract
    This paper describes micromachined bandpass filters, design at K band, on GaAs and silicon substrates, respectively. The performance of a three-layer (supported by 2 μm AlGaAs membrane) and two-layer (solid) filter structure on a GaAs substrate are compared and discussed. Electromagnetic simulation shows less than 1 dB insertion loss and acceptable stop band rejection for both the solid two-layer and membrane three-layer filter structure. A two-layer filter structure with a cavity on the bottom wafer is also proposed on a silicon substrate, where 10 μm SiO2 is used as a membrane. Both EM simulation results and mechanical analysis are provided. The boundary element method is used in mechanical simulation and a deflection of about 1.338 μm is obtained for the SiO2 membrane.
  • Keywords
    band-pass filters; boundary-elements methods; equivalent circuits; micromechanical resonators; microwave filters; resonator filters; 1 dB; 1.338 micron; 10 micron; 2 micron; 24 GHz; AlGaAs; EM analysis; GaAs; K band filters; SiO2; bandpass filters; bottom wafer cavity structure; boundary element method; equivalent circuit model; insertion loss; mechanical analysis; membrane deflection; micromachined filter; resonator filters; stop band rejection; Band pass filters; Biomembranes; Dielectric losses; Electromagnetic analysis; Gallium arsenide; Microwave filters; Power transmission lines; Resonator filters; Silicon; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
  • Print_ISBN
    0-7803-8511-X
  • Type

    conf

  • DOI
    10.1109/ICSICT.2004.1435168
  • Filename
    1435168