DocumentCode :
3266568
Title :
PXI and VXI modular instrumentation in the new millennium
Author :
Puls, Carsten
Author_Institution :
Nat. Instrum. Corp., Austin, TX, USA
fYear :
1999
fDate :
1999
Firstpage :
623
Lastpage :
625
Abstract :
Instrumentation has evolved in many ways over the past several decades. Standards such as GPIB and VXI made open, multi-vendor test systems possible and personal computer technology stretched overall capabilities and ease-of-use. Test technology for the new millennium now includes CompactPCI with PXI extensions. PXI directly couples PC technology with traditional instrument capabilities found in VXI to result in broader measurement and automation capabilities. Advanced measurement technology combined with the fast processing capabilities of today´s PCs result in performance gains of more than 10X when comparing PXI to older architectures. As PXI continues to grow, it is important to understand its relationship to VXI. A solid understanding of both architectures will help test engineers in the new millennium to properly configure systems using PXI, VXI, or both
Keywords :
automatic test equipment; peripheral interfaces; virtual instrumentation; CompactPCI; MXI modular instrumentation; PXI extensions; VXI modular instrumentation; advanced measurement technology; fast processing capabilities; integrating multiple platforms; interoperability; software extensions; test technology; Automation; Clocks; Computer aided manufacturing; Computer architecture; Electrical products industry; Gain measurement; Instruments; Manufacturing industries; Microcomputers; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
Conference_Location :
San Antonio, TX
ISSN :
1080-7725
Print_ISBN :
0-7803-5432-X
Type :
conf
DOI :
10.1109/AUTEST.1999.800437
Filename :
800437
Link To Document :
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