DocumentCode :
3267442
Title :
Far-infrared non-phasematched SHG pulse duration measurements in DAST
Author :
Van Dantzig, Niels A. ; Bakker, Huib J. ; Planken, Paul C M
Author_Institution :
FOM Inst. for Plasma Phys., Nieuwegein, Netherlands
Volume :
2
fYear :
1997
fDate :
10-13 Nov 1997
Firstpage :
244
Abstract :
The free electron laser for infrared experiments (FELIX) emits tunable radiation between 5 and 100 ym. Unfortunately, it is very difficult to diagnose pulses in this wavelength region because conventional nonlinear optical materials have strong absorption bands that attenuate the laser pulses at the fundamental and/or second harmonic wavelength. Here, we report on the use of the organic salt dimethylamino-4-N-methylstilbazolium tosylate (DAST) to generate the second harmonics of radiation at a fundamental wavelength between 30 μm and 55 μm. We demonstrate that with this technique we can measure the duration of FELIX pulses in a second harmonic autocorrelation setup
Keywords :
free electron lasers; high-speed optical techniques; infrared sources; laser tuning; laser variables measurement; optical correlation; optical harmonic generation; optical materials; organic compounds; 30 to 55 mum; 5 to 100 mum; DAST; FELIX; FELIX pulse duration measurement; FIR; far-infrared non-phasematched SHG pulse duration measurements; free electron laser for infrared experiments; fundamental wavelength; laser pulse attenuation; laser pulse measurements; nonlinear optical materials; organic salt dimethylamino-4-N-methylstilbazolium tosylate; second harmonic autocorrelation setup; second harmonic generation; strong absorption bands; tunable radiation; Autocorrelation; Electromagnetic wave absorption; Electron emission; Free electron lasers; Optical harmonic generation; Optical materials; Optical pulses; Pulse measurements; Tunable circuits and devices; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE
Conference_Location :
San Francisco, CA
ISSN :
1092-8081
Print_ISBN :
0-7803-3895-2
Type :
conf
DOI :
10.1109/LEOS.1997.645396
Filename :
645396
Link To Document :
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