DocumentCode :
3267758
Title :
Optimal power flow for reactive power compensation increasing the cross-border transmission capacity
Author :
Farrokhseresht, Mana ; Hesamzadeh, Mohammad Reza ; Rahimi, Saeed ; Lin, Jeremy
Author_Institution :
Electr. Power Syst. Dept., KTH R. Inst. of Technol., Stockholm, Sweden
fYear :
2015
fDate :
10-13 June 2015
Firstpage :
2135
Lastpage :
2140
Abstract :
Increasing the Net Transfer Capacity (NTC) of tie-lines between different grid areas may lead to a decrease in the cost to generate electricity in one area if this cost is more expensive than the cost of importing power from neighbouring areas over those tie-lines. An effective means to increase the cross-border transmission capacity is by installing reactive power compensation devices. In this paper, a multi-objective optimization is devised that optimally locates and sizes reactive compensation devices in a grid, so that the net benefit of increasing the NTC value of a tie-line is maximized and the maximum voltage stability indicator (L-index) in the grid area is minimized, indicating there is enough voltage stability margin. The genetic algorithm NSGA-II is implemented to perform the optimization. The IEEE 30-bus and 14-bus test grids are used as two interconnected areas.
Keywords :
IEEE standards; genetic algorithms; load flow control; power grids; power system control; reactive power control; voltage control; IEEE 14-bus test grids; IEEE 30-bus test grids; NSGA-II; cross-border transmission capacity; genetic algorithm; maximum voltage stability indicator; multiobjective optimization; net transfer capacity; optimal power flow; power grid; reactive compensation device; reactive power compensation; Capacitors; Generators; Genetic algorithms; Linear programming; Optimization; Power system stability; Reactive power; L-indices; NSGA-II; Net Transfer Capacity; Reactive Power Planning; reactive power compensation; voltage stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Environment and Electrical Engineering (EEEIC), 2015 IEEE 15th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4799-7992-9
Type :
conf
DOI :
10.1109/EEEIC.2015.7165508
Filename :
7165508
Link To Document :
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