• DocumentCode
    3267903
  • Title

    Modulation characteristics and harmonic distortion of VCSEL arrays and multi transverse mode VCSELs

  • Author

    Satuby, Yinon ; Orenstein, Meir

  • Author_Institution
    Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
  • Volume
    2
  • fYear
    1997
  • fDate
    10-13 Nov 1997
  • Firstpage
    289
  • Abstract
    In conclusion, a simple-to-fabricate single mode VCSEL yields high bandwidth modulation. Large area multi mode devices which are the best choice for optical interconnection, exhibited a “flattened” frequency response resulting from higher transverse modes operation - which is better for digital modulation. Devices lasing at few lower order modes produced mode beating, which resulted in a non-uniform frequency response, and a lower effective bandwidth. Detailed modulation results for both single and multi supermodecoherent arrays are and will be presented and analyzed
  • Keywords
    electro-optical modulation; frequency response; harmonic distortion; laser cavity resonators; laser modes; light coherence; quantum well lasers; semiconductor laser arrays; surface emitting lasers; VCSEL arrays; digital modulation; few lower order modes; flattened frequency response; harmonic distortion; high bandwidth modulation; higher transverse modes operation; large area multi mode devices; lower effective bandwidth; mode beating; modulation characteristics; multi supermodecoherent arrays; multi transverse mode VCSELs; nonuniform frequency response; optical interconnection; simple-to-fabricate single mode VCSEL yield; single supermodecoherent arrays; Frequency measurement; Frequency response; Harmonic distortion; Laser modes; Optical arrays; Optical interconnections; Resonance; Resonant frequency; Surface emitting lasers; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    1092-8081
  • Print_ISBN
    0-7803-3895-2
  • Type

    conf

  • DOI
    10.1109/LEOS.1997.645425
  • Filename
    645425