DocumentCode :
3268207
Title :
Temperature-adaptive body-bias and supply voltage scaling for enhanced energy efficiency in nano-CMOS circuits
Author :
Kumar, Ranjith ; Kursun, Volkan
Author_Institution :
Univ. of Wisconsin - Madison, Madison
fYear :
2007
fDate :
5-8 Aug. 2007
Firstpage :
702
Lastpage :
705
Abstract :
Temperature dependent propagation delay characteristics of CMOS circuits will experience a complete reversal in the near future. Contrary to the older technology generations, the speed of standard zero-body-biased circuits in a 32 nm CMOS technology is enhanced when the temperature is increased at the nominal supply voltage. The enhancement of circuit speed provides new opportunities to lower the energy consumed by active circuits at elevated temperatures. Temperature-adaptive supply and threshold voltage tuning techniques are proposed in this paper to reduce the high temperature active mode energy consumption without degrading the circuit speed. Results indicate that the energy consumption can be lowered by up to 21% by dynamically scaling the supply voltage at elevated temperatures. An alternative technique based on temperature-adaptive reverse body-bias exponentially reduces the leakage currents as well as the parasitic junction capacitances of the MOSFETs. The temperature-adaptive threshold voltage tuning through reverse body-bias yields an active mode energy reduction by up to 29.8% as compared to the standard zero body-biased circuits at high temperatures.
Keywords :
CMOS integrated circuits; active networks; MOSFET; active circuits; circuit speed; energy efficiency enhancement; high temperature active mode energy consumption; leakage currents; nanoCMOS circuits; nominal supply voltage; parasitic junction capacitances; supply voltage scaling; temperature dependent propagation delay characteristics; temperature-adaptive body-bias; temperature-adaptive threshold voltage tuning; zero-body-biased circuits; Active circuits; CMOS technology; Circuit optimization; Degradation; Energy consumption; Energy efficiency; Leakage current; Propagation delay; Temperature dependence; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2007. MWSCAS 2007. 50th Midwest Symposium on
Conference_Location :
Montreal, Que.
ISSN :
1548-3746
Print_ISBN :
978-1-4244-1175-7
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2007.4488675
Filename :
4488675
Link To Document :
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