• DocumentCode
    3268522
  • Title

    Locally Testable Codes Require Redundant Testers

  • Author

    Ben-Sasson, Eli ; Guruswami, Venkatesan ; Kaufman, Tali ; Sudan, Madhu ; Viderman, Michael

  • Author_Institution
    Dept. of Comput. Sci., Technion - Israel Inst. of Technol., Haifa, Israel
  • fYear
    2009
  • fDate
    15-18 July 2009
  • Firstpage
    52
  • Lastpage
    61
  • Abstract
    Locally testable codes (LTCs) are error- correcting codes for which membership, in the code, of a given word can be tested by examining it in very few locations. Most known constructions of locally testable codes are linear codes, and give error-correcting codes whose duals have (superlinearly) many small weight codewords. Examining this feature appears to be one of the promising approaches to proving limitation results for (i.e., upper bounds on the rate of) LTCs. Unfortunately till now it was not even known if LTCs need to be non-trivially redundant, i.e., need to have one linear dependency among the low-weight codewords in its dual. In this paper we give the first lower bound of this form, by showing that every positive rate constant query strong LTC must have linearly many redundant low-weight codewords in its dual. We actually prove the stronger claim that the actual test itself must use a linear number of redundant dual codewords (beyond the minimum number of basis elements required to characterize the code); in other words, non-redundant (in fact, low redundancy) local testing is impossible.
  • Keywords
    error correction codes; linear codes; parity check codes; error-correcting codes; linear codes; locally testable codes; redundant dual codewords; redundant low-weight codewords; redundant testers; Computational complexity; Computer errors; Computer science; Error correction codes; Hamming distance; Linear code; Redundancy; Testing; USA Councils; Upper bound; LDPC codes; dual codes; linear codes; lower bounds; property testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Complexity, 2009. CCC '09. 24th Annual IEEE Conference on
  • Conference_Location
    Paris
  • ISSN
    1093-0159
  • Print_ISBN
    978-0-7695-3717-7
  • Type

    conf

  • DOI
    10.1109/CCC.2009.6
  • Filename
    5231218