Title :
A proposed strategy for testing and verification of complex chip [uses EM signatures]
Author_Institution :
Sch. of Eng., Liverpool John Moores Univ., UK
Abstract :
Manufacturers are under pressure to reduce costs. The design reuse concept, which makes use of predesigned components, is an attempt to reduce the cost of the superchip or the so-called system-on-a-chip (SoC). However, the production of such a complex chip may enhance performance, speed, and reliability, but also incurs a cost burden. It has been anticipated that the cost of testing an SoC may exceed the cost of fabricating the chip, and hence new approaches are needed to deal with the ever-increasing cost of testing. The strategy proposed here is an attempt to reduce such cost by focusing the attention on adopting a virtual test and spreading the cost throughout the manufacturing process.
Keywords :
crosstalk; formal verification; industrial property; integrated circuit testing; logic testing; system-on-chip; EM signature identification; IP; SoC testing costs; chip verification; complex chip testing; crosstalk effect modelling; design reuse; intellectual property; system-on-a-chip; test cost spreading; virtual test; Analytical models; Automatic test pattern generation; CMOS technology; Circuit faults; Circuit testing; Costs; Hardware; Software performance; Software prototyping; Test pattern generators;
Conference_Titel :
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN :
0-7803-8511-X
DOI :
10.1109/ICSICT.2004.1435245