DocumentCode :
3268585
Title :
A proposed strategy for testing and verification of complex chip [uses EM signatures]
Author :
Kadim, H.J.
Author_Institution :
Sch. of Eng., Liverpool John Moores Univ., UK
Volume :
3
fYear :
2004
fDate :
18-21 Oct. 2004
Firstpage :
2047
Abstract :
Manufacturers are under pressure to reduce costs. The design reuse concept, which makes use of predesigned components, is an attempt to reduce the cost of the superchip or the so-called system-on-a-chip (SoC). However, the production of such a complex chip may enhance performance, speed, and reliability, but also incurs a cost burden. It has been anticipated that the cost of testing an SoC may exceed the cost of fabricating the chip, and hence new approaches are needed to deal with the ever-increasing cost of testing. The strategy proposed here is an attempt to reduce such cost by focusing the attention on adopting a virtual test and spreading the cost throughout the manufacturing process.
Keywords :
crosstalk; formal verification; industrial property; integrated circuit testing; logic testing; system-on-chip; EM signature identification; IP; SoC testing costs; chip verification; complex chip testing; crosstalk effect modelling; design reuse; intellectual property; system-on-a-chip; test cost spreading; virtual test; Analytical models; Automatic test pattern generation; CMOS technology; Circuit faults; Circuit testing; Costs; Hardware; Software performance; Software prototyping; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN :
0-7803-8511-X
Type :
conf
DOI :
10.1109/ICSICT.2004.1435245
Filename :
1435245
Link To Document :
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