Title :
Design Strategy Of Mlscr Devices For Sub-micron Cmos Technology
Author :
Lu, T.C. ; Guo, J.C. ; Wang, M.T. ; Shone, F.
Keywords :
CMOS technology; Circuits; Electric breakdown; Electrostatic discharge; Epitaxial layers; MOSFETs; Protection; Region 2; Temperature; Thyristors;
Conference_Titel :
VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-4131-7
DOI :
10.1109/VTSA.1997.614767
