Title :
An efficient framework for accelerating functional verification of microprocessor
Author :
Zuo-dong, Wang ; Ya-Juan, Siu ; Shao-jun, Wei
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing, China
Abstract :
The paper presents a simulation-based function verification framework featured by two efficient acceleration techniques, namely "self-verifying" and "co-simulation of mixed models". The former automates the verification process over the whole vector space by eliminating manual interference, the effect of which is directly proportional to the size of the vector space and the average vector size. The latter reduces the time required to simulate a full-chip netlist from exponential to linear relationships with the number of modules by co-simulating the mixed models of RTL and netlist. The benefit of this framework was well exhibited in the verification practice of a 32-bit high-end processor. A prototype processor fabricated on a 0.18 μm CMOS process technology functioned properly under a system environment test, which indicated that the verification framework presented is feasible.
Keywords :
CMOS digital integrated circuits; circuit simulation; integrated circuit design; microprocessor chips; 0.18 micron; CMOS process technology; design methodology; design resource; function verification framework; microprocessor functional verification; mixed model cosimulation; self-verifying technique; system environment test; Acceleration; Circuit simulation; Computational modeling; Formal verification; Microelectronics; Microprocessors; Prototypes; Semiconductor device modeling; Time to market; Vectors;
Conference_Titel :
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN :
0-7803-8511-X
DOI :
10.1109/ICSICT.2004.1435254