• DocumentCode
    3270210
  • Title

    Effect of low surface tension liquid on pattern collapse analyzed by dynamical meniscus observation

  • Author

    Kawai, Akira ; Suzuki, Kenta

  • Author_Institution
    Dept. of Electr. Eng., Nagaoka Univ. of Technol., Japan
  • fYear
    2005
  • fDate
    25-28 Oct. 2005
  • Firstpage
    70
  • Lastpage
    71
  • Abstract
    It is well known that Laplace force affects strongly to the resist pattern collapse phenomena during pattern development procedure (Tanaka et al., 1993). Recently, it is reported that the pattern collapse can be improved by using the low surface tension liquid (Tanaka et al., 1993). So far, we reported the air tunnel formation in the bottom meniscus during drying process (Ishikawa et al., 2004). It was clearly observed that the water meniscus enters from the both bottom edges of the parallel pattern. The purpose of this study is to clarify the drying behavior of the meniscus between the parallel thin films, when the low surface tension liquid is employed as the rinse liquid.
  • Keywords
    drying; resists; surface tension; thin films; Laplace force; drying behavior; dynamical meniscus observation; low surface tension liquid; parallel thin films; resist pattern collapse; rinse liquid; water meniscus; Pattern analysis; Plastic films; Polyethylene; Positron emission tomography; Resists; Shape; Stress; Surface tension; Transistors; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2005 International
  • Print_ISBN
    4-9902472-2-1
  • Type

    conf

  • DOI
    10.1109/IMNC.2005.203742
  • Filename
    1595218