DocumentCode :
3270512
Title :
Convertibility of conduction type in Al-N codoped ZnO thin films based on DC reactive magnetron sputtering
Author :
Yuan, Guodong ; Ye, Zhizhen ; Zhu, Liping ; Qing Qian ; Zhao, Binghui
Author_Institution :
State Key Lab. of Silicon Mater., Zhejiang Univ., Hangzhou, China
Volume :
3
fYear :
2004
fDate :
18-21 Oct. 2004
Firstpage :
2378
Abstract :
p-type conduction in ZnO thin films was realized by an Al-N codoping method. ZnO thin films were prepared in an NH3-O2 atmosphere with the substrate temperature in the range of 360-540°C with a 20°C space. Secondary ion mass spectroscopy (SIMS) tests proved that the presence of Al facilitated the incorporation of N into ZnO. A conversion from n-type conduction to p-type in a range of temperatures has been identified by measurements of the Hall effect and spreading resistance profiles. The Nls peak is located around 405.6eV in Al-N codoped ZnO thin films, compared with 401.7eV in the N alone-doped case, which may be due to the formation of Al-N bonds. The obtained p-type ZnO films shows a resistivity of 24.5 Ωcm, hole concentration of 7.48×1017 cm-3 at room temperature. A model showing nitrogen incorporation suggests the possibility of realizing p-type ZnO films of low resistivity by optimizing thermal annealing.
Keywords :
Hall effect; II-VI semiconductors; annealing; electric resistance; electrical resistivity; secondary ion mass spectroscopy; semiconductor doping; semiconductor thin films; sputter deposition; substrates; temperature; wide band gap semiconductors; 24.50 ohmcm; 360 to 540 C; 401.7 eV; 405.6 eV; DC reactive magnetron sputtering; Hall effect; II-VI semiconductor; NH3-O2; SIMS; ZnO:Al,N; aluminium-nitrogen codoped zinc oxide thin films; ammonia-oxygen atmosphere; hole concentration; n-type conduction; p-type conduction; resistivity; secondary ion mass spectroscopy; spreading resistance profiles; thermal annealing optimization; Atmosphere; Atmospheric measurements; Conductivity; Electrical resistance measurement; Hall effect; Mass spectroscopy; Sputtering; Temperature distribution; Testing; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN :
0-7803-8511-X
Type :
conf
DOI :
10.1109/ICSICT.2004.1435325
Filename :
1435325
Link To Document :
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