DocumentCode
3270585
Title
Dependence of acid yield on resist thickness in chemically amplified electron beam resist
Author
Shigaki, T. ; Okamoto, K. ; Kozawa, T. ; Yamamoto, H. ; Tagawa, S.
Author_Institution
Inst. of Sci. & Ind. Res., Osaka Univ., Japan
fYear
2005
fDate
25-28 Oct. 2005
Firstpage
112
Lastpage
113
Abstract
In this work, we quantified acid density generated in chemically amplified EB resists. The dependence of acid yield on resist thickness was made clear. The average density of acids nonlinearly increased with resist thickness. Although the accumulated energy is a good indicator, we have to consider how energy is consumed to generate acids for the accurate prediction of acid yields.
Keywords
electron resists; acid density; acid yield; chemically amplified resist; electron beam resist; resist thickness; Absorption; Chemicals; Electron beams; Lithography; Optical films; Pattern formation; Polymers; Protons; Resists; Thickness measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocesses and Nanotechnology Conference, 2005 International
Print_ISBN
4-9902472-2-1
Type
conf
DOI
10.1109/IMNC.2005.203763
Filename
1595239
Link To Document