• DocumentCode
    3270585
  • Title

    Dependence of acid yield on resist thickness in chemically amplified electron beam resist

  • Author

    Shigaki, T. ; Okamoto, K. ; Kozawa, T. ; Yamamoto, H. ; Tagawa, S.

  • Author_Institution
    Inst. of Sci. & Ind. Res., Osaka Univ., Japan
  • fYear
    2005
  • fDate
    25-28 Oct. 2005
  • Firstpage
    112
  • Lastpage
    113
  • Abstract
    In this work, we quantified acid density generated in chemically amplified EB resists. The dependence of acid yield on resist thickness was made clear. The average density of acids nonlinearly increased with resist thickness. Although the accumulated energy is a good indicator, we have to consider how energy is consumed to generate acids for the accurate prediction of acid yields.
  • Keywords
    electron resists; acid density; acid yield; chemically amplified resist; electron beam resist; resist thickness; Absorption; Chemicals; Electron beams; Lithography; Optical films; Pattern formation; Polymers; Protons; Resists; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2005 International
  • Print_ISBN
    4-9902472-2-1
  • Type

    conf

  • DOI
    10.1109/IMNC.2005.203763
  • Filename
    1595239