• DocumentCode
    3270717
  • Title

    Hybrid 3D-IC Cooling System Using Micro-fluidic Cooling and Thermal TSVs

  • Author

    Shi, Bing ; Srivastava, Ankur ; Bar-Cohen, Avram

  • Author_Institution
    Univ. of Maryland, College Park, MD, USA
  • fYear
    2012
  • fDate
    19-21 Aug. 2012
  • Firstpage
    33
  • Lastpage
    38
  • Abstract
    3D-ICs bring about new challenges to chip thermal management due to their high heat densities. Micro-channel based liquid cooling and thermal through-silicon-vias (TSVs) have been adopted to alleviate the thermal issues in 3D-ICs. Thermal TSV (which have no electrical significance), enables higher interlayer thermal conductivity thereby achieving a more uniform thermal profile. While somewhat effective in reducing temperatures, they are limited by the nature of the heat sink. On the other hand, micro-channel based liquid cooling is significantly capable of addressing 3D IC cooling needs but consumes a lot of extra power for pumping coolant through channels. This paper proposes a hybrid 3D-IC cooling scheme which combines micro-channel liquid cooling and thermal TSV with one acting as heat removal agent while the other enabling beneficial heat conduction paths to the micro-channel structures. The experimental results show that, the proposed hybrid cooling scheme provides much better cooling capability than using only thermal TSVs, while consuming 55% less cooling power compared with pure micro-channel cooling.
  • Keywords
    cooling; integrated circuit packaging; microfluidics; thermal management (packaging); three-dimensional integrated circuits; 3D-IC cooling system; chip thermal management; microchannel based liquid cooling; microfluidic cooling; thermal TSV; through-silicon-vias; Conductivity; Heat sinks; Thermal conductivity; Through-silicon vias; Trigeneration; 3D-IC; cooling; micro-channel; thermal TSV;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI (ISVLSI), 2012 IEEE Computer Society Annual Symposium on
  • Conference_Location
    Amherst, MA
  • ISSN
    2159-3469
  • Print_ISBN
    978-1-4673-2234-8
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2012.29
  • Filename
    6296444