• DocumentCode
    3270724
  • Title

    Differentiating trapping sets with the same label [w; u]

  • Author

    Zheng, X. ; Lau, Francis C M ; Tse, C.K.

  • Author_Institution
    Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., Hong Kong, China
  • fYear
    2009
  • fDate
    8-10 Dec. 2009
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Trapping sets (TSs) have been known to contribute to errors in the decoding of low-density parity-check (LDPC) codes, particularly at the high signal-to-noise ratio (SNR) region. Moreover, TSs with the same label [w; u] are considered equivalent under the automorphism of the graph of a regular code. But according to our our simulations, TSs with the same label [w; u] are producing different error rates in the case of irregular codes. In this paper, we will identify and explain the cause of the differences in error rates for TSs with the same label. Further, we will propose a simple mechanism to differentiate these TSs.
  • Keywords
    decoding; graph theory; parity check codes; LDPC codes; decoding; error rates; graph theory; low-density parity-check codes; regular code; signal-to-noise ratio; trapping sets; AWGN; Bit error rate; Electron traps; Error analysis; Helium; Iterative decoding; Memory; Monte Carlo methods; Parity check codes; Signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information, Communications and Signal Processing, 2009. ICICS 2009. 7th International Conference on
  • Conference_Location
    Macau
  • Print_ISBN
    978-1-4244-4656-8
  • Electronic_ISBN
    978-1-4244-4657-5
  • Type

    conf

  • DOI
    10.1109/ICICS.2009.5397616
  • Filename
    5397616