Title :
Direct imaging of 0.81 μm and 0.98 μm tapered and broad stripe semiconductor laser diodes
Author :
O´Brien, Peter ; McInerney, John
Author_Institution :
Dept. of Phys., Univ. Coll. Cork, Ireland
Abstract :
We have imaged the interiors of tapered and broad stripe semiconductor lasers under high current injection. Observation and analysis of the modal structure and internal catastrophic optical damage is presented
Keywords :
laser modes; semiconductor lasers; 0.81 micron; 0.98 micron; broad stripe semiconductor laser diode; current injection; direct imaging; internal catastrophic optical damage; modal structure; tapered semiconductor laser diode; Diode lasers; Laser modes; Laser noise; Laser theory; Nonlinear optics; Optical distortion; Optical harmonic generation; Power amplifiers; Semiconductor lasers; Spatial coherence;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-3895-2
DOI :
10.1109/LEOS.1997.645492
