DocumentCode
3271194
Title
Direct imaging of 0.81 μm and 0.98 μm tapered and broad stripe semiconductor laser diodes
Author
O´Brien, Peter ; McInerney, John
Author_Institution
Dept. of Phys., Univ. Coll. Cork, Ireland
Volume
2
fYear
1997
fDate
10-13 Nov 1997
Firstpage
409
Abstract
We have imaged the interiors of tapered and broad stripe semiconductor lasers under high current injection. Observation and analysis of the modal structure and internal catastrophic optical damage is presented
Keywords
laser modes; semiconductor lasers; 0.81 micron; 0.98 micron; broad stripe semiconductor laser diode; current injection; direct imaging; internal catastrophic optical damage; modal structure; tapered semiconductor laser diode; Diode lasers; Laser modes; Laser noise; Laser theory; Nonlinear optics; Optical distortion; Optical harmonic generation; Power amplifiers; Semiconductor lasers; Spatial coherence;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE
Conference_Location
San Francisco, CA
ISSN
1092-8081
Print_ISBN
0-7803-3895-2
Type
conf
DOI
10.1109/LEOS.1997.645492
Filename
645492
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