Open-circuit voltages due to lightning-generated time-dependent and elliptically polarized E-fields

The open-circuit voltage induced by an incident EM field generated by lightning may cause damage in electronic devices. An ideal and less realistic time-independent and linearly polarized E-field has been often used to predict this important parameter. This study generalizes the E-field incident to be time-dependent and elliptically polarized, and calculates the open-circuit voltages under this new environment for two popular but simple cable configurations. These results are then compared to those generated under the ideal and less realistic environment