DocumentCode

327194

Title

Catch The True Worst-case In Tolerance And Sensitivity Analysis By Genetic Algorithms And Affine Mathematics

Author

Egiziano, L. ; Femia, N. ; Spagnuolo, G. ; Vocca, G.

Author_Institution

Universita di Salerno

Volume

2

fYear

1998

fDate

14-15 May 1998

Firstpage

583

Lastpage

588

Keywords

Arithmetic; Circuit noise; Electronic equipment; Fluctuations; Genetic algorithms; Noise reduction; Problem-solving; Safety; Sensitivity analysis; Uncertainty;

fLanguage

English

Publisher

ieee

Conference_Titel

Optimization of Electrical and Electronic Equipments, 1998. OPTIM '98. Proceedings of the 6th International Conference on

Conference_Location

Brasov, Romania

Print_ISBN

973-98511-2-6

Type

conf

DOI

10.1109/OPTIM.1998.707999

Filename

707999