Title :
Analysis and measurement of nonlinear effects in power amplifiers caused by thermal power feedback
Author :
Schurack, E. ; Rupp, W. ; Latzel, T. ; Gottwald, A.
Author_Institution :
Inst. for Commun. Eng., Federal Armed Forces Univ. Munich, Neubiberg, Germany
Abstract :
In order to calculate and measure the influence of the internal-power-dependent thermally effected feedback in power amplifiers with bipolar transistors, a calculation method and measurement techniques are proposed, and results are presented. The aim was to describe a transistor including thermal power feedback and the surrounding network in a theoretical model, i.e. to find a mathematical description. A further objective was to clarify which distortion results from the pure electrical transistor properties and which additional distortion is caused by thermal feedback
Keywords :
bipolar transistor circuits; electric distortion; equivalent circuits; feedback; nonlinear network analysis; power amplifiers; bipolar transistors; electrical transistor properties; nonlinear distortion; nonlinear effects; power amplifiers; theoretical model; thermal power feedback; Bipolar transistors; Cause effect analysis; Fluctuations; Force feedback; Force measurement; Power amplifiers; Power dissipation; Power measurement; Thermal engineering; Thermal force;
Conference_Titel :
Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0593-0
DOI :
10.1109/ISCAS.1992.230111
