• DocumentCode
    3272158
  • Title

    A millimeter-wave flip-chip IC using micro-bump bonding technology

  • Author

    Sakai, Hiroki ; Ota, Yoshiharu ; Inoue, Ken ; Yanagihara, M. ; Matsuno, Toshiya ; Tanabe, M. ; Yoshida, Takafumi ; Ikeda, Yasuhiro ; Fujita, S. ; Takahashi, Koichi ; Sagawa, Masakazu

  • Author_Institution
    Electron. Res. Lab., Matsushita Electron. Corp., Osaka, Japan
  • fYear
    1996
  • fDate
    10-10 Feb. 1996
  • Firstpage
    408
  • Lastpage
    409
  • Abstract
    This millimeter-wave flip-chip IC (MFIC) is a compact hybrid constructed by bonding a mm-wave transistor or its IC chips upside down on thin film microstrip lines formed on a Si substrate. Production costs of this IC are expected to be drastically reduced compared with those of the conventional MMIC because the passive elements, which usually occupy large chip area, are formed not on the expensive heterostructure substrate, but on the low-cost Si substrate. Moreover, design flexibility such as a device choice and integration is expanded including the integration of antennas. Using 9 /spl mu/m-thick p-CVD SiO/sub 2/ as a dielectric film, microstrip lines on Si substrate were realized. Using MBB technology to fabricate K-band MFIC amplifiers demonstrates the MFIC concept.
  • Keywords
    flip-chip devices; hybrid integrated circuits; integrated circuit technology; microstrip lines; millimetre wave amplifiers; millimetre wave integrated circuits; 50 GHz; K-band; MBB technology; MFIC amplifiers; Si; compact hybrid; design flexibility; dielectric film; micro-bump bonding technology; millimeter-wave flip-chip IC; production costs; thin film microstrip lines; Bonding; Dielectric substrates; Hybrid integrated circuits; Microstrip; Millimeter wave technology; Millimeter wave transistors; Production; Semiconductor thin films; Submillimeter wave integrated circuits; Thin film transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1996. Digest of Technical Papers. 42nd ISSCC., 1996 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0193-6530
  • Print_ISBN
    0-7803-3136-2
  • Type

    conf

  • DOI
    10.1109/ISSCC.1996.488738
  • Filename
    488738