DocumentCode :
3272512
Title :
Fringe pattern profilometry based on inverse function analysis
Author :
Hu, Yingsong ; Xi, Jiangtao ; Li, Enbang ; Chicharo, Joe ; Yang, Zongkai
Author_Institution :
ScHoo of Electr. Comput. & Telecommun. Eng., Wollongong Univ., NSW, Australia
fYear :
2005
fDate :
13-16 Dec. 2005
Firstpage :
61
Lastpage :
64
Abstract :
In this paper, we proposed a new algorithm, referred to as inverse function analysis (IFA) method based on the derived mathematical model to reconstruct 3-D surfaces using fringe pattern profilometry (FPP) technique. Compared with traditional methods, our algorithm has neither the requirement for the structure of projected fringe patterns, nor the prior knowledge of the characteristics of projection systems. The correctness of inverse function analysis (IFA) method has been confirmed by simulation results. It can be seen that the measurement accuracy has been significantly improved by inverse function analysis (IFA) method, especially when the expected sinusoidal fringe patterns are distorted by unknown nonlinear factors.
Keywords :
image reconstruction; 3D surface reconstruction; fringe pattern profilometry; inverse function analysis; Charge coupled devices; Charge-coupled image sensors; Distortion measurement; Gratings; Image analysis; Image reconstruction; Information analysis; Mathematical model; Pattern analysis; Surface reconstruction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Signal Processing and Communication Systems, 2005. ISPACS 2005. Proceedings of 2005 International Symposium on
Print_ISBN :
0-7803-9266-3
Type :
conf
DOI :
10.1109/ISPACS.2005.1595346
Filename :
1595346
Link To Document :
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