Title :
A New Method of Test Generation for Sequential Circuits
Author :
Hou, Yanli ; Zhao, Chunhui ; Liao, Yanping
Author_Institution :
Sch. of Inf. & Commun. Eng., Harbin Eng. Univ.
Abstract :
The constant development of integrated circuits makes the automatic test pattern generation problem of sequential circuits a challenging area. Test generation procedures based on genetic algorithm (GA) have been showed to be effective in achieving high fault coverage. This paper presents a new approach to the test generation for synchronous sequential circuits. In this work, we address the problem of the automation test sequences generation based on particle swarm optimization (PSO) and fault simulation for sequential circuits. We emphasize three aspects: initialization, test sequence generation and test set compaction. Experimental results illustrate the effectiveness of the approach. PSO-based STPG is generally superior to GA-based STPG in terms of achieved fault coverage and required CPU time
Keywords :
automatic test pattern generation; genetic algorithms; particle swarm optimisation; sequential circuits; CPU time; GA; PSO; STPG; automatic test pattern generation; genetic algorithm; integrated circuits; particle swarm optimization; synchronous sequential circuits; Automatic test pattern generation; Automatic testing; Automation; Circuit faults; Circuit testing; Genetic algorithms; Particle swarm optimization; Sequential analysis; Sequential circuits; Synchronous generators;
Conference_Titel :
Communications, Circuits and Systems Proceedings, 2006 International Conference on
Conference_Location :
Guilin
Print_ISBN :
0-7803-9584-0
Electronic_ISBN :
0-7803-9585-9
DOI :
10.1109/ICCCAS.2006.285109