• DocumentCode
    3273498
  • Title

    Development of statistical parameter measuring equipment

  • Author

    Shinozuka, Takashi

  • Author_Institution
    Electromagn. Compatibility Res. Labs. Co. Ltd., Sendai, Japan
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    792
  • Abstract
    A statistical parameter of disturbance is effective to estimate BER degradation of a digital link due to the disturbance. For the statistical parameter, an amplitude probability distribution (APD) gives a characteristic of the amplitude domain of the disturbance, and, furthermore, a crossing rate distribution (CRD) and a pulse duration distribution (PDD) give time domain characteristics. It has been reported that BER degradation of a digital link such as PHS or PDC due to disturbances emitted from microwave ovens can be estimated from the APD data of the disturbance. It is also necessary to obtain the CRD and PDD data of disturbance in order to make a digital link which has countermeasures against burst noise by using interleave techniques, etc. In this paper, APD/CRD/PDD measuring equipment is introduced and demonstrated
  • Keywords
    digital communication; electromagnetic compatibility; electromagnetic interference; error statistics; measurement systems; APD/CRD/PDD measuring equipment; BER degradation; EMC; PDC; PHS; amplitude domain characteristics; amplitude probability distribution; burst noise; crossing rate distribution; digital link; disturbance; interleave techniques; microwave ovens; pulse duration distribution; statistical parameter measuring equipment development; time domain characteristics; Bit error rate; Counting circuits; Degradation; Electromagnetic compatibility; Electromagnetic measurements; Instruction sets; Laboratories; Microwave ovens; Probability distribution; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1999 International Symposium on
  • Conference_Location
    Tokyo
  • Print_ISBN
    4-9980748-4-9
  • Type

    conf

  • DOI
    10.1109/ELMAGC.1999.801451
  • Filename
    801451