Title :
Study of head and disk interface in contact start stop test
Author :
Lee, H.J. ; Hempstead, R. ; Weiss, J.
Author_Institution :
Domain Technology
Keywords :
Rails; Testing; Transistors;
Conference_Titel :
Magnetics Conference, 1989. Digests of INTERMAG '89., International
Conference_Location :
Washington, DC, USA
DOI :
10.1109/INTMAG.1989.690148
