DocumentCode
327391
Title
Wavelet analysis of scintillation discharge current on DC tracking resistance of gamma-ray irradiated polyethylene and modified polycarbonate
Author
Du, Boxue ; Kobayashi, Shigeo
Author_Institution
Niigata Coll. of Technol., Japan
fYear
1998
fDate
22-25 Jun 1998
Firstpage
456
Lastpage
459
Abstract
The use of organic insulating materials in environments such as space and nuclear power stations is spreading rapidly. There is increasing concern about the reliability of electrical insulation in these environments due to radiation effects on the surface characteristics of polymeric materials. Irradiation effects on tracking resistance should be investigated due to the increasing usage of organic materials in radiation-prone environments. This paper presents a study on the DC tracking resistance of gamma-ray irradiated polyethylene and modified-polycarbonate materials by use of the International Electrotechnical Commission (IEC) Publication (Publ.) 112 method. Polyethylene and modified-polycarbonate materials were irradiated in air up to 1×107 R and 1×108 R with dosage rates of 106 R/hr using a 60Co gamma source as the test samples. The total radiation effects on erosion depth and scintillation discharge energy levels were studied. A gaussian wavelet analysis was applied to show these scintillation discharge energy levels
Keywords
discharges (electric); gamma-ray effects; organic insulating materials; polyethylene insulation; polymers; scintillation; wavelet transforms; DC tracking resistance; electrical insulation; erosion depth; gamma ray irradiation; modified polycarbonate; organic insulating material; polyethylene; scintillation discharge current; surface characteristics; wavelet analysis; Electric resistance; Energy states; Fault location; Insulation life; Organic materials; Polyethylene; Power generation; Radiation effects; Space power stations; Wavelet analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Conduction and Breakdown in Solid Dielectrics, 1998. ICSD '98. Proceedings of the 1998 IEEE 6th International Conference on
Conference_Location
Vasteras
Print_ISBN
0-7803-4237-2
Type
conf
DOI
10.1109/ICSD.1998.709323
Filename
709323
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