DocumentCode
3274155
Title
Innovative solutions to enable smaller substrate bump pad size for flip chip technology
Author
Lai, Cheah Seaw ; Yoon, Ang Toon ; Koang, Chen Chee ; Singh, Kuljeet ; Earley, Anita
Volume
2
fYear
2004
fDate
1-4 June 2004
Firstpage
1471
Abstract
Semiconductor technology is marching towards miniature size, but in contrast requires higher I/Os, which leads to growth in package size and die size for performance enhancement. Therefore the package designer needs to break the conventional design rule and innovate a way to fit more I/Os into the same package/die size, One of the key design rules that fits such criteria is substrate solder resist opening (SRO) design. It is the key element driving the die size and substrate size growth. By optimizing the solder resist opening dimension, the die size can reduce significantly to 15% less. However, when technology pushes the envelop to meet the criteria, a side effect surfaced, which relates to quality and reliability issues. The issues were found at silicon and package integration level. Various options and evaluations were carried out to enable the smaller SRO technology. The success of this project has brought the company significant cost savings for current and future products.
Keywords
ball grid arrays; circuit optimisation; flip-chip devices; integrated circuit packaging; integrated circuit reliability; voids (solid); FCBGA; I/O connection number; SRO technology; die bump voiding defect; die size; flip chip technology; package integration; package quality; package reliability; package size; silicon integration; substrate bump pad size; substrate solder resist opening optimization; Assembly; Atherosclerosis; Failure analysis; Flip chip; Materials testing; Packaging; Resists; Silicon; Substrates; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN
0-7803-8365-6
Type
conf
DOI
10.1109/ECTC.2004.1320308
Filename
1320308
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