• DocumentCode
    3274155
  • Title

    Innovative solutions to enable smaller substrate bump pad size for flip chip technology

  • Author

    Lai, Cheah Seaw ; Yoon, Ang Toon ; Koang, Chen Chee ; Singh, Kuljeet ; Earley, Anita

  • Volume
    2
  • fYear
    2004
  • fDate
    1-4 June 2004
  • Firstpage
    1471
  • Abstract
    Semiconductor technology is marching towards miniature size, but in contrast requires higher I/Os, which leads to growth in package size and die size for performance enhancement. Therefore the package designer needs to break the conventional design rule and innovate a way to fit more I/Os into the same package/die size, One of the key design rules that fits such criteria is substrate solder resist opening (SRO) design. It is the key element driving the die size and substrate size growth. By optimizing the solder resist opening dimension, the die size can reduce significantly to 15% less. However, when technology pushes the envelop to meet the criteria, a side effect surfaced, which relates to quality and reliability issues. The issues were found at silicon and package integration level. Various options and evaluations were carried out to enable the smaller SRO technology. The success of this project has brought the company significant cost savings for current and future products.
  • Keywords
    ball grid arrays; circuit optimisation; flip-chip devices; integrated circuit packaging; integrated circuit reliability; voids (solid); FCBGA; I/O connection number; SRO technology; die bump voiding defect; die size; flip chip technology; package integration; package quality; package reliability; package size; silicon integration; substrate bump pad size; substrate solder resist opening optimization; Assembly; Atherosclerosis; Failure analysis; Flip chip; Materials testing; Packaging; Resists; Silicon; Substrates; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2004. Proceedings. 54th
  • Print_ISBN
    0-7803-8365-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2004.1320308
  • Filename
    1320308