• DocumentCode
    3274400
  • Title

    Electrical connector under heavy vibration generating EMI: its laboratory repetition and analysis

  • Author

    Wu, Wei ; Rossetto, Leopoldo ; Luo, Wei

  • Author_Institution
    Inf. Eng. Dept., Padova Univ., Italy
  • Volume
    2
  • fYear
    2002
  • fDate
    5-8 Nov. 2002
  • Firstpage
    1225
  • Abstract
    This paper reports that the electrical connector loading current under heavy mechanical vibration can generate electromagnetic interference (EMI). The phenomenon is revealed by an accidental EMC test, and is confirmed in this paper with a series laboratory repetition made in both an open laboratory for direct measurement and a shielded chamber for radiation test. By means of wavelet de-noise and Fourier transform analysis, both experiments show similar measurement results and come to the conclusion that such EMI is caused by mechanical vibration which happens irregularly with similar characters under poor connection conditions.
  • Keywords
    Fourier transforms; electric connectors; electromagnetic compatibility; electromagnetic interference; immunity testing; testing; vibrations; EMI generation; Fourier transform analysis; accidental EMC test; electrical connector; electromagnetic interference; heavy vibration; mechanical vibration; open site test; radiation test; series laboratory repetition; shielded chamber; wavelet de-noise; Connectors; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic measurements; Fourier transforms; Laboratories; Mechanical variables measurement; Testing; Vibration measurement; Wavelet analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IECON 02 [Industrial Electronics Society, IEEE 2002 28th Annual Conference of the]
  • Print_ISBN
    0-7803-7474-6
  • Type

    conf

  • DOI
    10.1109/IECON.2002.1185448
  • Filename
    1185448