Title :
Electromigration Avoidance Aware Net Splitting Algorithm in Analog Circuits
Author :
Xue, Bing ; He, Xiangqing
Author_Institution :
Inst. of Microelectron. CAD, Tsinghua Univ., Beijing
Abstract :
Electromigration caused by insufficient wire width can result in the unwanted failure of a circuit. Different from digital circuits, analog circuits may have a multitude of different current levels. It is therefore an important issue to concern about current densities in routing procedure for analog circuits, especially in the net splitting step. In this paper, we present a fast terminal tree construction algorithm taking current into account and apply simulated annealing approach to net area minimization. Experimental results show that compared with previous algorithms, our algorithm gives much smaller areas of multi-terminal nets.
Keywords :
analogue circuits; current density; electromigration; failure analysis; network routing; simulated annealing; analog circuits; circuit failure; current density; electromigration avoidance aware net splitting algorithm; fast terminal tree construction algorithm; multiterminal nets; net area minimization; routing procedure; simulated annealing approach; Aluminum; Analog circuits; Current density; Digital circuits; Electromigration; Grain boundaries; Minimization methods; Routing; Simulated annealing; Wire;
Conference_Titel :
Communications, Circuits and Systems Proceedings, 2006 International Conference on
Conference_Location :
Guilin
Print_ISBN :
0-7803-9584-0
Electronic_ISBN :
0-7803-9585-9
DOI :
10.1109/ICCCAS.2006.285250