• DocumentCode
    3275297
  • Title

    The Design of the Microwave T/R Module Automation Test System Based on the Embedded System

  • Author

    Wen, Yang ; Kai-Yu, Qin ; Pi-yan, He

  • Author_Institution
    Sch. of Autom. Eng., Univ. of Electron. Sci. Technol. of China, Chengdu
  • Volume
    4
  • fYear
    2006
  • fDate
    25-28 June 2006
  • Firstpage
    2817
  • Lastpage
    2821
  • Abstract
    This paper describes the design principles of the automated test system for microwave T/R module, with the embedded system achieving the function control of the whole system. The system could implement automatic measurement of all the time domain and frequency domain parameters in the sixteen 32-channel modules using the single-connection multiple-measurement (SCMM) technique, and conduct automatic S-parameter test and error correction under both continuous wave and pulse according to presetted test programs. With the application of the embedded system, the system ranks a high flexibility, high reliability, open infrastructure and good scalability, and the performance specification has made it among the advanced products worldwide.
  • Keywords
    S-parameters; automatic test equipment; embedded systems; error correction; phased array radar; S-parameter test; automation test system; embedded systems; error correction; frequency domain parameters; microwave T/R module; phased array radar; time domain parameters; Automatic control; Automatic testing; Control systems; Design automation; Embedded system; Frequency domain analysis; Frequency measurement; Pulse measurements; System testing; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Circuits and Systems Proceedings, 2006 International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    0-7803-9584-0
  • Electronic_ISBN
    0-7803-9585-9
  • Type

    conf

  • DOI
    10.1109/ICCCAS.2006.285253
  • Filename
    4064500