DocumentCode
3275297
Title
The Design of the Microwave T/R Module Automation Test System Based on the Embedded System
Author
Wen, Yang ; Kai-Yu, Qin ; Pi-yan, He
Author_Institution
Sch. of Autom. Eng., Univ. of Electron. Sci. Technol. of China, Chengdu
Volume
4
fYear
2006
fDate
25-28 June 2006
Firstpage
2817
Lastpage
2821
Abstract
This paper describes the design principles of the automated test system for microwave T/R module, with the embedded system achieving the function control of the whole system. The system could implement automatic measurement of all the time domain and frequency domain parameters in the sixteen 32-channel modules using the single-connection multiple-measurement (SCMM) technique, and conduct automatic S-parameter test and error correction under both continuous wave and pulse according to presetted test programs. With the application of the embedded system, the system ranks a high flexibility, high reliability, open infrastructure and good scalability, and the performance specification has made it among the advanced products worldwide.
Keywords
S-parameters; automatic test equipment; embedded systems; error correction; phased array radar; S-parameter test; automation test system; embedded systems; error correction; frequency domain parameters; microwave T/R module; phased array radar; time domain parameters; Automatic control; Automatic testing; Control systems; Design automation; Embedded system; Frequency domain analysis; Frequency measurement; Pulse measurements; System testing; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Circuits and Systems Proceedings, 2006 International Conference on
Conference_Location
Guilin
Print_ISBN
0-7803-9584-0
Electronic_ISBN
0-7803-9585-9
Type
conf
DOI
10.1109/ICCCAS.2006.285253
Filename
4064500
Link To Document