Title :
System performance of PSI technique as a function of key parameters
Author :
Younus, Md Iqbal ; Loomis, John S. ; Al-Salehi, Ghazwan
Author_Institution :
Dept. of Electr. Eng., Dayton Univ., OH, USA
Abstract :
Phase stepped interferometry (PSI) technique uses a charge coupled device (CCD) camera for intensity image acquisition and allow for near real-time full field object displacement measurements. Since this technique deals with nanometer level displacements, accuracy is a big factor for this method. System parameters of this technique control the accuracy of the measurement and hence determine the system´s performance. In this paper an effort is made to explain the characteristics of the key parameters and their role in determining system´s performance. The optimum value of the parameters have been chosen after a careful observation. A simulated result has also been presented using the valve of the parameters in order to show the importance of key parameters on system´s performance
Keywords :
CCD image sensors; digital simulation; displacement measurement; holographic interferometry; image processing; CCD camera; PSI technique; charge coupled device camera; full field object displacement measurement; intensity image acquisition; key parameters; phase stepped interferometry; real-time; simulated result; Charge coupled devices; Charge-coupled image sensors; Displacement measurement; Educational institutions; Equations; Interference; Optical interferometry; Phase measurement; System performance; Telephony;
Conference_Titel :
Aerospace and Electronics Conference, 1998. NAECON 1998. Proceedings of the IEEE 1998 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-4449-9
DOI :
10.1109/NAECON.1998.710211