DocumentCode
3276154
Title
Development of laser speckle metrology and its identification techniques
Author
Yeh, Ruey-Nan ; Sung, Po-yi ; Yeh, Chia-Hung ; Tseng, Wen-Yu ; Yeh, Jin-wei ; Chang, Yen-hao
Author_Institution
Chung-Shan Inst. of Sci. & Technol., Taoyuan, Taiwan
Volume
3
fYear
2011
fDate
10-13 July 2011
Firstpage
1381
Lastpage
1385
Abstract
The main goal of this paper is to identify last speckle images rapidly. Digital image processing techniques are employed to analyze the characteristics of laser speckle images and match them up to achieve laser speckle image identification. Besides the database is built to accelerate the identification process and further enhance its practicability. In terms of building the database, Gabor filter is utilized to enhance the extracted characteristics as well as to generate the feature vectors. The final step is adopting K-means clustering to build the classification model of feature vectors. The process of identifying laser speckle images is described as follows. Through experiments we observed that scale invariant feature transform (SIFT) can extract features of laser speckle images very well. However the drawback is that it took too much time to compute and match up those features, which is not suitable for fast laser speckle identification. Therefore the proposed method took enhance SIFT as backbone. Experimental results demonstrate that the retrieval performance of the proposed method is accurate when the database size contains 516 images.
Keywords
Gabor filters; feature extraction; image classification; image enhancement; image matching; measurement by laser beam; optical images; pattern clustering; speckle; transforms; vectors; Gabor filter; K-mean clustering; SIFT; digital image processing technique; feature extraction; feature vector classification model; laser speckle image identification; laser speckle image matching; laser speckle metrology; scale invariant feature transform; Databases; Feature extraction; Laser modes; Machine learning; Security; Speckle; Gabor feature; K-means; Laser speckle image; SIFT;
fLanguage
English
Publisher
ieee
Conference_Titel
Machine Learning and Cybernetics (ICMLC), 2011 International Conference on
Conference_Location
Guilin
ISSN
2160-133X
Print_ISBN
978-1-4577-0305-8
Type
conf
DOI
10.1109/ICMLC.2011.6016876
Filename
6016876
Link To Document