DocumentCode :
327624
Title :
Electromagnetic Susceptibility Of TTL And CMOS Inverters. Influence Of Pulseform And External Elements
Author :
Weissgerber, Tycho ; Peier, Dirk ; Hirsch, Holger
Author_Institution :
University of Dortmund
Volume :
1
fYear :
1998
fDate :
14-15 May 1998
Firstpage :
257
Lastpage :
262
Keywords :
Circuit faults; Circuit testing; Digital integrated circuits; Electromagnetic compatibility; Immunity testing; Impedance; Logic; Pulse inverters; Pulse width modulation inverters; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optimization of Electrical and Electronic Equipments, 1998. OPTIM '98. Proceedings of the 6th International Conference on
Conference_Location :
Brasov, Romania
Print_ISBN :
973-98511-2-6
Type :
conf
DOI :
10.1109/OPTIM.1998.710484
Filename :
710484
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=327624
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