• DocumentCode
    3276275
  • Title

    Sub-threshold charge recovery circuits

  • Author

    Khatir, Mehrdad ; Mohammadi, Hassan Ghasemzadeh ; Ejlali, Alireza

  • Author_Institution
    Dept. of Comput. Eng., Sharif Univ. of Technol., Tehran, Iran
  • fYear
    2010
  • fDate
    3-6 Oct. 2010
  • Firstpage
    138
  • Lastpage
    144
  • Abstract
    Embedded systems account for wide range of applications. However, the design of such systems is faced with a diverse spectrum of criteria. The energy consumption, performance, and demanding security concerns are some of the most significant challenges in designing of such systems. With these challenges, the design process can be managed more easily if a flexible logic circuit with the ability of satisfying the above-mentioned concerns is taken into account. To achieve such a logic circuit, in this paper we have combined the sub-threshold operation and charge recovery techniques. Using our technique, lower power consumption, ability of operating at higher frequencies, and more security (to side channel attacks) than the existing logic circuits are achieved. This paper also presents an analytical proof about how sub-threshold charge recovery circuits can meet these characterizations. we have also confirmed our analytical discussions by examining our technique for full adder, and 8×8 carry-save multiplier in different frequencies, supply voltages, and CMOS technologies. Detailed SPICE simulations show significant improvements as compared to its existing counterparts in all simulated frequencies and supply voltages.
  • Keywords
    SPICE; embedded systems; energy consumption; flexible electronics; logic circuits; SPICE simulations; embedded systems; energy consumption; flexible logic circuit; security; sub-threshold charge recovery circuits; Adders; CMOS integrated circuits; Energy consumption; Integrated circuit modeling; Inverters; Power demand; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design (ICCD), 2010 IEEE International Conference on
  • Conference_Location
    Amsterdam
  • ISSN
    1063-6404
  • Print_ISBN
    978-1-4244-8936-7
  • Type

    conf

  • DOI
    10.1109/ICCD.2010.5647815
  • Filename
    5647815