DocumentCode
3276372
Title
Dielectric Relaxation Behavior of PEEK during the Loss of the Coolant Accident
Author
Kim, K.Y. ; Lee, C. ; Ryu, B.H.
Author_Institution
Korea Atomic Energy Research Institute, Jeongup, Chonbuk, Korea. E-mail: kykim2@kaeri.re.kr
fYear
2007
fDate
8-13 July 2007
Firstpage
98
Lastpage
101
Abstract
Dielectric relaxation behavior of poly(etheretherketone) (PEEK) during the loss of coolant accident (LOCA) was investigated. The result of the temperature dependency of the dielectric properties indicated that the glass transition temperature of the aged PEEK increased as increasing radiation doses and thermal ageing time. The relaxation intensity calculated using Cole-Cole´s circular arc could be useful for the evaluation of the PEEK degradation.
Keywords
Accelerated aging; Accidents; Coolants; Crystalline materials; Dielectric losses; Dielectrics and electrical insulation; Electric resistance; Temperature dependence; Thermal degradation; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid Dielectrics, 2007. ICSD '07. IEEE International Conference on
Conference_Location
Winchester, UK
Print_ISBN
1-4244-0750-8
Electronic_ISBN
1-4244-0751-6
Type
conf
DOI
10.1109/ICSD.2007.4290762
Filename
4290762
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