Title :
On-chip near-field THz imaging probe integrated with a detector
Author :
Kawano, Yukio ; Ishibashi, Koji
Author_Institution :
Adv. Device Lab., RIKEN, Wako
Abstract :
We present an all-integrated near-field terahertz imaging probe on a semiconductor. This robust and easy-to-use scheme enables us to detect only the evanescent field very efficiently. We obtain a spatial resolution corresponding to lambda/24.
Keywords :
semiconductor materials; submillimetre wave detectors; submillimetre wave imaging; detector; evanescent field; on-chip near-field THz imaging probe; semiconductor; spatial resolution; Apertures; Carbon nanotubes; Detectors; Gallium arsenide; High-resolution imaging; Image resolution; Microwave imaging; Optical imaging; Probes; Spatial resolution;
Conference_Titel :
Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on
Conference_Location :
Pasadena, CA
Print_ISBN :
978-1-4244-2119-0
Electronic_ISBN :
978-1-4244-2120-6
DOI :
10.1109/ICIMW.2008.4665647
