Design for manufacturability: a two-step analytic modeling approach

Author

Guardiani, C. ; Nicollini, G. ; Franzini, B.

Author_Institution

SGS-Thomson Microelectron., Milan, Italy

Volume

4

fYear

1992

fDate

3-6 May 1992

Firstpage

1997

Abstract

A yield optimization technique that uses macromodels of the circuit performance to strongly reduce the computational effort is presented. Global macromodels were accurately obtained by means of experimental design and linear regression methods. The technique was then used to obtain an analytic representation of the yield as a function of the designable parameters by modeling the results of multiple Monte Carlo analyses. An example of the application of the proposed approach to a CMOS operational amplifier is included

Keywords

CMOS integrated circuits; Monte Carlo methods; circuit CAD; operational amplifiers; CMOS operational amplifier; circuit performance; computational effort; designable parameters; linear regression; macromodels; multiple Monte Carlo analyses; two-step analytic modeling; yield; yield optimization technique; Circuits; Design for experiments; Design optimization; Fabrication; Microelectronics; Monte Carlo methods; Polynomials; Random variables; Virtual manufacturing; Yield estimation;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on

Conference_Location

San Diego, CA

Print_ISBN

0-7803-0593-0

Type

conf

DOI

10.1109/ISCAS.1992.230385

Filename

230385