• DocumentCode
    3277103
  • Title

    Close-from model of shunt capacitance and inductance of microstrip step discontinuities

  • Author

    Singh, Himanshu ; Verma, A.K.

  • Author_Institution
    Dept. of Electron. Sci., Univ. of Delhi, New Delhi
  • fYear
    2008
  • fDate
    15-19 Sept. 2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Some results for the inductance and capacitance associated with a step discontinuity in a microstrip are available. We present a model on the based on K.C. Gupta proposal for inductance having a maximum deviation 5% and average deviation 3% for isinr =9.6 and compare the numerical calibration with de-embedding techniques used in the planar electromagnetic (EM) simulation (SONNET) for isinr = 2.3, 4.0, 15.1, 20.0 & 40.0. These techniques are used to eliminate the port discontinuities brought by the current/voltage exciting source. The closed form model for step shunt capacitance having a maximum deviation 10% and average deviation 4.66% for 2.3 les isin, les 40.0 against numerical results of the internal equation method. The models have average deviation 0.027 for the Cp and 0.015 for Ls against the results of Sonnet.
  • Keywords
    capacitance; inductance; microstrip discontinuities; SONNET; current-voltage exciting source; deembedding techniques; inductance; internal equation method; microstrip discontinuities; microstrip line; numerical analysis; planar electromagnetic simulation; shunt capacitance; Capacitance; Circuit simulation; Circuit testing; Curve fitting; Equations; Inductance; Logistics; Microstrip; Multidimensional systems; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on
  • Conference_Location
    Pasadena, CA
  • Print_ISBN
    978-1-4244-2119-0
  • Electronic_ISBN
    978-1-4244-2120-6
  • Type

    conf

  • DOI
    10.1109/ICIMW.2008.4665657
  • Filename
    4665657