DocumentCode
3277103
Title
Close-from model of shunt capacitance and inductance of microstrip step discontinuities
Author
Singh, Himanshu ; Verma, A.K.
Author_Institution
Dept. of Electron. Sci., Univ. of Delhi, New Delhi
fYear
2008
fDate
15-19 Sept. 2008
Firstpage
1
Lastpage
2
Abstract
Some results for the inductance and capacitance associated with a step discontinuity in a microstrip are available. We present a model on the based on K.C. Gupta proposal for inductance having a maximum deviation 5% and average deviation 3% for isinr =9.6 and compare the numerical calibration with de-embedding techniques used in the planar electromagnetic (EM) simulation (SONNET) for isinr = 2.3, 4.0, 15.1, 20.0 & 40.0. These techniques are used to eliminate the port discontinuities brought by the current/voltage exciting source. The closed form model for step shunt capacitance having a maximum deviation 10% and average deviation 4.66% for 2.3 les isin, les 40.0 against numerical results of the internal equation method. The models have average deviation 0.027 for the Cp and 0.015 for Ls against the results of Sonnet.
Keywords
capacitance; inductance; microstrip discontinuities; SONNET; current-voltage exciting source; deembedding techniques; inductance; internal equation method; microstrip discontinuities; microstrip line; numerical analysis; planar electromagnetic simulation; shunt capacitance; Capacitance; Circuit simulation; Circuit testing; Curve fitting; Equations; Inductance; Logistics; Microstrip; Multidimensional systems; Scattering parameters;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on
Conference_Location
Pasadena, CA
Print_ISBN
978-1-4244-2119-0
Electronic_ISBN
978-1-4244-2120-6
Type
conf
DOI
10.1109/ICIMW.2008.4665657
Filename
4665657
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