DocumentCode
327711
Title
Test feature classifiers: performance and application
Author
Lashkia, V. ; Aleshin, S.
Author_Institution
Dept. of Inf. & Comput. Eng., Okayama Univ. of Sci., Japan
Volume
1
fYear
1998
fDate
16-20 Aug 1998
Firstpage
341
Abstract
In this paper, we present class of combinatorical-logical classifiers called test feature classifiers. Introducing kernels and a rejection option we discuss the properties and performance of the proposed classifiers. To test the performance of the classifiers, we apply them to both artificial and real data, and compare them with conventional ones. Experimental results show that the proposed classifiers yield a higher recognition rate than conventional ones, have a high ability of generalization, and suggest that they can be used in a variety of pattern recognition applications
Keywords
combinatorial mathematics; formal logic; pattern classification; combinatorical-logical classifiers; generalization; kernels; rejection; test feature classifiers; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 1998. Proceedings. Fourteenth International Conference on
Conference_Location
Brisbane, Qld.
ISSN
1051-4651
Print_ISBN
0-8186-8512-3
Type
conf
DOI
10.1109/ICPR.1998.711150
Filename
711150
Link To Document