• DocumentCode
    327711
  • Title

    Test feature classifiers: performance and application

  • Author

    Lashkia, V. ; Aleshin, S.

  • Author_Institution
    Dept. of Inf. & Comput. Eng., Okayama Univ. of Sci., Japan
  • Volume
    1
  • fYear
    1998
  • fDate
    16-20 Aug 1998
  • Firstpage
    341
  • Abstract
    In this paper, we present class of combinatorical-logical classifiers called test feature classifiers. Introducing kernels and a rejection option we discuss the properties and performance of the proposed classifiers. To test the performance of the classifiers, we apply them to both artificial and real data, and compare them with conventional ones. Experimental results show that the proposed classifiers yield a higher recognition rate than conventional ones, have a high ability of generalization, and suggest that they can be used in a variety of pattern recognition applications
  • Keywords
    combinatorial mathematics; formal logic; pattern classification; combinatorical-logical classifiers; generalization; kernels; rejection; test feature classifiers; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 1998. Proceedings. Fourteenth International Conference on
  • Conference_Location
    Brisbane, Qld.
  • ISSN
    1051-4651
  • Print_ISBN
    0-8186-8512-3
  • Type

    conf

  • DOI
    10.1109/ICPR.1998.711150
  • Filename
    711150