Title :
Improving the accuracy of thin film dielectric characterization using the Kalman filter
Author :
Kohl, Paul A. ; Bidstrup-Allen, S.A.
Abstract :
Using an inverse method known as the Kalman filter on microstrip resonance measurements, calculations of dielectric constant and loss tangent can be improved compared to other methods and error bars better constrained
Keywords :
Kalman filters; dielectric loss measurement; dielectric thin films; inverse problems; microstrip filters; microwave measurement; permittivity measurement; Kalman filter; dielectric constant; error bars; inverse method; loss tangent; microstrip resonance measurement; thin film dielectric;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1996., IEEE 5th Topical Meeting
Conference_Location :
Napa, CA
Print_ISBN :
0-7803-3514-7
DOI :
10.1109/EPEP.1996.564786
