• DocumentCode
    3277222
  • Title

    Investigation on Leakage Current of Silicone Rubber Insulator in Salt-fog Chamber

  • Author

    Du, B.X. ; Liu, Yong ; Wang, Li

  • Author_Institution
    Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin
  • fYear
    2007
  • fDate
    8-13 July 2007
  • Firstpage
    277
  • Lastpage
    280
  • Abstract
    An artificial salt-fog chamber was employed to investigate leakage current of silicone rubber (SIR) insulator under the severe contamination in coastal areas. The high-frequency components of leakage current were extracted to obtain the corresponding high- frequency cumulative charge for studying multi-effects of salt-fog conductance, relative humidity and ambient temperature. The high-frequency cumulative charge, in agreement with the dry-band discharge, is associated with the magnitude and distortion of leakage current. It is found that the cumulative charge at 550 Hz shows the biggest value in the high-frequency components. With increasing the conductance from 1.0 to 3.0 mS/cm, the cumulative charge increases, but decreases from 3.0 to 5.0 mS/cm. With the increase of relative humidity and ambient temperature, the cumulative charge increases. It is suggested that the high-frequency components of leakage current have the strongest influence on the surface deterioration of SIR insulators.
  • Keywords
    fog; high-frequency discharges; leakage currents; silicone rubber insulators; dry-band discharge; frequency 550 Hz; high-frequency cumulative charge; leakage current; relative humidity; salt-fog chamber; silicone rubber insulator; Dielectrics and electrical insulation; Frequency estimation; Humidity; Leakage current; Rubber; Surface contamination; Surface discharges; Surface resistance; Surface waves; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics, 2007. ICSD '07. IEEE International Conference on
  • Conference_Location
    Winchester
  • Print_ISBN
    1-4244-0750-8
  • Electronic_ISBN
    1-4244-0751-6
  • Type

    conf

  • DOI
    10.1109/ICSD.2007.4290806
  • Filename
    4290806