DocumentCode :
3277234
Title :
The creation of compact thermal models of electronic components using model reduction
Author :
Guo, X. ; Celo, D. ; Gunupudi, P. ; Khazaka, R. ; Walkey, D.J. ; Smy, T. ; Nakhla, M.
Author_Institution :
Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada
fYear :
2004
fDate :
9-11 Mar 2004
Firstpage :
104
Lastpage :
110
Abstract :
This paper presents a new approach to create boundary condition independent thermal compact models based on the multidimensional model reduction (MDMR) technique. A methodology is developed for the generation of a multi dimensional compact model (MDCM) from a detailed numerical model. The MDCM is shown to have a number of advantages over resistor network models. The generation of the model is at least an order of magnitude faster then the creation of an optimized network model. The MDCM displays very high accuracy typically better than 0.1%, is very flexible allowing for the prediction of all internal temperatures, and presents no limitations on the external configuration of the compact model. A generic multi-chip module ball grid array (MCMBGA) package is used to demonstrate the technique. The MDCM created shows to have high predictive capability, boundary condition independence and a small model size. Finally, by connecting the MDCM to a printed circuit board model and simulating the system, speed ups of around 100 times are achieved.
Keywords :
ball grid arrays; integrated circuit modelling; printed circuits; thermal management (packaging); boundary condition independence; compact thermal models; electronic components; external configuration; generic multi-chip module ball grid array package; high predictive capability; internal temperatures; multidimensional model reduction; small model size; Boundary conditions; Displays; Electronic components; Electronics packaging; Multidimensional systems; Numerical models; Predictive models; Reduced order systems; Resistors; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2004. Twentieth Annual IEEE
ISSN :
1065-2221
Print_ISBN :
0-7803-8363-X
Type :
conf
DOI :
10.1109/STHERM.2004.1291309
Filename :
1320460
Link To Document :
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